Applied and Computational Engineering

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Proceedings of the 2023 International Conference on Mechatronics and Smart Systems

Series Vol. 9 , 25 September 2023


Open Access | Article

Study on short circuit effect of silicon carbide power devices

Yinghao Huang * 1
1 University of Macau

* Author to whom correspondence should be addressed.

Applied and Computational Engineering, Vol. 9, 34-42
Published 25 September 2023. © 25 September 2023 The Author(s). Published by EWA Publishing
This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Citation Yinghao Huang. Study on short circuit effect of silicon carbide power devices. ACE (2023) Vol. 9: 34-42. DOI: 10.54254/2755-2721/9/20230027.

Abstract

SiC can provide better material properties when the performance of Si - based power devices is almost developed to the limit. But compared with Si material, the reliability of SiC device is poor under ultimate stress. The short circuit capability of SiC MOSFET has been the main area of attention in this paper’s study. Through the analysis of SiC MOSFET short-circuit capability, it is mainly represented by the time that the device can withstand short-circuit stress and the time it takes for the device to be safely turned off in the event of a short circuit fault. Secondly, the detection circuit and protection circuit under the SiC MOSFET short-circuit fault are briefly studied, and the optimization ideas and working principles are summarized.

Keywords

SiC MOSFET, short circuit characteristic, protection circuit.

References

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Data Availability

The datasets used and/or analyzed during the current study will be available from the authors upon reasonable request.

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Volume Title
Proceedings of the 2023 International Conference on Mechatronics and Smart Systems
ISBN (Print)
978-1-83558-007-3
ISBN (Online)
978-1-83558-008-0
Published Date
25 September 2023
Series
Applied and Computational Engineering
ISSN (Print)
2755-2721
ISSN (Online)
2755-273X
DOI
10.54254/2755-2721/9/20230027
Copyright
25 September 2023
Open Access
This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited

Copyright © 2023 EWA Publishing. Unless Otherwise Stated